The X-Ray Fluorescence Analysis is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems.
Measuring times range in the seconds, rarely longer than one minute. Measurements can be completed quickly and usually without extensive sample preparation. With XRF, it is possible to measure both thickness and chemical composition of homogeneous materials and also for alloy/under coatings.